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U. Glaeser

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FIGURE 2.22 CMOS SRAM cell with read amplifier and data write circuitry [6].<br />

the row select signal is applied, the voltage level on complementary bit line C′ drops slightly because it<br />

is pulled down by T2 and T4. The data read circuitry detects the small voltage difference between C and<br />

C′ lines (C is higher) and amplifies it as logic “1” output. The data read circuitry can be constructed as<br />

a simple source-coupled differential amplifier or as a differential current-mirror sense amplifier circuit<br />

(as indicated in Fig. 2.22). The current-mirror sense amplifier achieves a faster read time than the simple<br />

source-coupled read amplifier. The read access speed can be further improved by two- or three-stage<br />

current mirror differential sense amplifiers [6].<br />

Dynamic RAM Circuits<br />

All RAMs lose their contents when power supply is turned off. However, some RAMs gradually lose the<br />

information even if power is not turned off, because the information is held in a capacitor. Those RAMs<br />

need periodic refreshing of information in order to retain the data. They are called dynamic RAMs or<br />

DRAMs.<br />

Static RAM cells require 4–6 transistors per cell and need 4–5 lines connecting to each cell including<br />

power, ground, bit lines, and word lines. It is desirable to realize memory cells with fewer transistors and<br />

less area, in order to construct high density RAM arrays. The early steps in this direction were to create<br />

a 4-transistor cell as in Fig. 2.23(a) by removing the load devices of the 6-transistor SRAM cell. The data<br />

is stored in a cross-coupled transistor pair as in the SRAM cells we discussed earlier. But it should be<br />

noted that voltage from the storage node is continuously being lost due to parasitic capacitance, and<br />

there is no current path from a power supply to the storage node to restore the charge lost due to leakage.<br />

Hence, the cell must be refreshed periodically. This 4-transistor cell has some marginal area advantage<br />

over the 6-transistor SRAM cell, but not any significant advantage. An improvement over the 4-transistor<br />

DRAM cell is the 3-transistor DRAM cell shown in Fig. 2.23(b). Instead of using a cross-coupled transistor<br />

pair, this cell uses a single transistor as the storage device. The transistor is turned ON or OFF depending<br />

© 2002 by CRC Press LLC

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