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U. Glaeser

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FIGURE 47.12 Layout of two metal layers of operational amplifier and corresponding critical (overlap) areas.<br />

of the critical areas is limited by the error made in approximation of the circular parts by rectangular<br />

subareas.<br />

To analyze the performance of the algorithm, an idealized model is used. If there are n uniformly<br />

distributed rectangles in a region of interest, there will be around √n rectangles, on an average, in each<br />

scan-line. Based upon this model, the time complexity of the algorithm is analyzed. Step 1 in the algorithm<br />

© 2002 by CRC Press LLC<br />

(a) (b)<br />

FIGURE 47.13 Layout of metal 1 of input pad and corresponding critical areas for shorts (a) and opens (b).

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