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U. Glaeser

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direct properly scaled and logically restored currents to the outputs. The variety of current-mode MVL<br />

circuits reported by various authors over the past decade use various combinations of these three<br />

operations (algebraic sum, compare to thresholds, and switch correct logical current values to the outputs)<br />

to realize all the circuit functions reported.<br />

Most current-mode CMOS MVL circuits have the advantage that they will operate properly at proposed<br />

reduced CMOS power supply voltages. Critics of current-mode CMOS binary and MVL circuits worry<br />

that static current-mode circuits dissipate DC power. Dynamic current-mode CMOS circuits use additional<br />

clocked pairs of transistors and additional clock signals to reduce or eliminate DC power dissipation.<br />

Current-mode CMOS circuits have a fanout of only one, yet, if the loading is known in advance as<br />

is often the case in VLSI design, circuits may be designed very easily with the appropriate number of<br />

individual outputs. Given all the possible advantages and disadvantages of current-mode CMOS circuits,<br />

it is apparent that they warrant continued study. We do not propose that current-mode CMOS MVL<br />

circuits be used, in general, as a replacement for binary voltage-mode CMOS circuits. We do, however,<br />

claim that it may be advantageous in some situations to imbed current-mode CMOS MVL circuits in a<br />

binary design. In the discussions that follow, we review several of the input/output compatible currentmode<br />

CMOS MVL circuits that we have studied over the past decade. These current-mode CMOS circuits,<br />

reviewed in [15], include a simple current threshold comparator [16], MVL encoders and decoders,<br />

quaternary threshold logic full adders (QFAs), current-mode MVL latches, latched current-mode QFA<br />

circuits, and current-mode analog-to-quaternary converter circuits. Each of these circuits is presented<br />

and its performance described. In the next section, the simple current threshold comparator circuit is<br />

described.<br />

CMOS Current Threshold Comparator<br />

A key component in the design of current-mode MVL threshold circuits is the current comparator [16],<br />

or current threshold detector. Performance limitations of the current comparator will determine our<br />

MVL threshold circuits’ ability to discriminate between different input current levels. The current comparator’s<br />

operation is now summarized. The simplest form of the current comparator circuit, shown in<br />

Fig. 11.2, is made up of the diode-connected input NMOS transistor M1,<br />

and NMOS transistor M2<br />

connected to replicate this input current, a reference or threshold current generating pair of transistors<br />

M3<br />

and M4,<br />

and a PMOS transistor M5<br />

that replicates the reference or threshold current. The current in<br />

the input mirror transistor M2<br />

limits at the threshold value as the comparator switches. The drains of<br />

the PMOS replicating transistor M5<br />

and NMOS replicating transistor M2<br />

are connected to generate the<br />

comparator circuit’s output voltage. This comparator circuit is to provide a logical HIGH output voltage<br />

when the input current is less than the threshold current and a logical LOW output voltage when the<br />

input current is greater than the threshold current. (To make a current comparator that gives a logical<br />

HIGH output voltage when the input current is greater than the threshold current and a logical LOW<br />

output voltage when the input current is less than the threshold current we can simply reverse the roles<br />

of the NMOS and PMOS transistors.) Greatest comparator discrimination is obtained by using maximum<br />

comparator gain. This current comparator configuration converts the input current to a voltage, VGS1,<br />

that drives a common-source amplifier with an active load. An equivalent way to describe the operation<br />

of this circuit is to consider it a current mirror that reproduces Iin<br />

as ID,<br />

and ID<br />

then drives a highimpedance<br />

active load to convert the current difference to an output voltage. We can analyze the<br />

comparator to find the transresistance amplifier gain, Ro,<br />

to be the parallel combination of the output<br />

resistances of the NMOS driver and PMOS load devices:<br />

where λ represents the channel length modulation effect and has units of V . A large gain is desired to<br />

provide a sharp comparator transition and greater noise margin. Lower threshold current values will increase<br />

the gain at the expense of greater comparator delay times when driving a constant load. Use of higher<br />

© 2002 by CRC Press LLC<br />

Ro ( ID( λp + λN) ) 1 –<br />

=<br />

−1

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