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U. Glaeser

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FIGURE 31.15 Receiver design using clocked amplifier/sampler as first stage.<br />

level-shifted 12 to accommodate the clocked comparator that follows [34]. A high clock level resets the<br />

comparator shown in Fig. 31.14. The negative clock edge samples the data and starts a positive feedback<br />

that regeneratively amplifies the sampled value to digital values during the low clock phase. To demultiplex<br />

the data, the comparators operate on different clock phases. The amplification is exponentially dependent<br />

on the duration of the low phase. Because the comparator has high gain, the first stage does not need<br />

significant gain. Some gain reduces the effective input offset voltage since the contribution of the comparator’s<br />

offset is divided by the gain. Mismatch in the feedback devices and clock coupling of the comparators<br />

can introduce significant offsets. For very high data rates, the drawback of the design is that the first<br />

stage must have sufficient bandwidth to minimize ISI. Furthermore, delay variation of the first stage can<br />

add timing noise.<br />

A simple design can avoid ISI by eliminating the first stage and sampling/demultiplexing the input with<br />

comparators directly [24,52]. Because the comparators are reset before each sample, no signal energy from<br />

previous bits remains hence removing ISI; however, direct sampling is noisier and has larger static offsets.<br />

Figure 31.15 illustrates an alternate design that clocks the first stage to remove ISI but still conditions the<br />

signal [26,43]. During the low phase of the clock, the amplifier output is reset. During the high phase<br />

of the clock, the amplifier conditions the data. For demultiplexing, two clocked amplifiers loads the input.<br />

A comparator samples the amplifier output to further amplify to digital levels. The clock used for the clocked<br />

amplifier must be timed with the arriving signal to amplify the proper bit. The timing issue will be discussed<br />

in section 31.4.<br />

dc Offsets<br />

Random dc offsets limit the voltage resolution of the receiver. These offset are due to random mismatches<br />

in the devices and scales inversely with the size of the device [35]. Because minimum size devices are often<br />

used to minimize pin capacitance and power dissipation, input-referred offset of amplifiers and comparators<br />

can be tens of millivolts.<br />

To compensate for the error, devices are added that can create an offset in either the first amplifier or<br />

the comparator. The control can be open-loop where the compensation value is determined with an<br />

initial calibration [10]. Figure 31.16(a) shows a comparator with digitally controllable switches that<br />

differentially inject an error current. The open-loop compensation is commonly digital so the value does<br />

not drift in time. Alternatively, the control can be continuously operating and closed-loop [51]. As shown<br />

in Figure 31.16(b), a third nonoverlapping clock phase, clk 1, is added to the reset and amplify (clk 0) phases<br />

of operation. Clk 1 reconfigures the amplifier to short the inputs and to store the value of the offset on<br />

12 The input common-mode voltage depends on the transmitter and the I/O specification.<br />

© 2002 by CRC Press LLC<br />

V i+<br />

clocked amplifier 0 o<br />

clk<br />

bias<br />

clk<br />

Vo Vo ref<br />

clocked amplifier 180 o

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