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when used as a flip-flop, the NAND3 is skewed favoring the high-to-low transition, while the middle<br />

stack is complementary. This is because if the middle stack were skewed, favoring the low-to-high transition,<br />

the opposite transition would become critical. When the circuit is used as a transparent latch, all<br />

stages are static. (i.e., both transitions are balanced). The worst-case transition in this case is opposite<br />

to that shown in Fig. 10.74: input D is switching and the total delay is equal to 1.2 + 1.5 + 1.2 = 3.9. In<br />

the case of SDFF (Fig. 10.74(j)), since the middle stack is shorter, both the first stage (precharged) and<br />

the middle stack are skewed.<br />

A similar procedure to the one described above is followed to compute the minimum CK-to-Q delay.<br />

An additional assumption is that the output buffer has FO1 as opposed to FO4 as in max-timing, which<br />

results in shorter delay. The normalized FO1 pull-up delay of a buffer is 0.6 (PMOS), and the pull-down<br />

is 0.5 (NMOS).<br />

To compute hold time the following assumptions are made. The inverters used in inverting or delaying<br />

clock signals, with the exception of external pulse generators (see Fig. 10.65), have FO1, so their delays<br />

are those of the previous paragraph. External pulse generators use three FO4 inverters instead (i.e., slower),<br />

because in practical designs it is very hard to create a full-rail pulse waveforms with less delay. For<br />

transparent-high latches, the hold time is defined as the time from CK switching high-to-low until all<br />

shutoff devices are completely turned off. To insure the shutoff device is completely off, 50% delay is<br />

added to the last clock driver. For instance, the hold time of the transparent-low transmission gate latch<br />

is 0.5 (FO1 inverter delay) × 1.5 = 0.75. For a positive edge-triggered flip-flop, the hold time is defined<br />

as the time from CK switching low-to-high until all shutoff devices are completely turned off. If there is<br />

one or more stages before the shutoff device, the corresponding delay is subtracted from the hold time.<br />

This is the case of the buffered master-slave flip-flop (Fig. 10.74(e)), which results in a negative hold<br />

time. An exception to this definition is the case of HLFF or SDFF. Here, the timing of the shutoff device<br />

must allow that the stack gets fully discharged. Therefore, the hold time is limited by the stack delay,<br />

which is again defined as 1.5 times the stage delay. For instance, for HLFF, the middle stage pull-down<br />

delay is 1.3, so the hold time is 1.5 × 1.3 = 1.95. SDFF, instead, has its hold time determined by the timing<br />

of the shutoff device because the precharged stage is fast.<br />

References<br />

1. B. Curran, et al., “A 1.1 GHz first 64 b generation Z900 microprocessor,” ISSCC Digest of Technical<br />

Papers, pp. 238–239, Feb. 2001.<br />

2. G. Lauterbach, et al., “UltraSPARC-III: a 3rd-generation 64 b SPARC microprocessor,” ISSCC Digest<br />

of Technical Papers, pp. 410−411, Feb. 2000.<br />

3. D. Harris, “Skew-Tolerant Circuit Design,” Morgan Kaufmann Publishers, San Francisco, CA, 2001.<br />

4. W. Burleson, M. Ciesielski, F. Klass, and W. Liu: “Wave-pipelining: A tutorial and survey of recent<br />

research,” IEEE Trans. on VLSI Systems, Sep. 1998.<br />

5. R. Krambeck, et al. “High-speed compact circuits with CMOS,” IEEE J. Solid-State Circuits, vol. 17,<br />

no. 6, pp. 614–619, June 1982.<br />

6. N. Goncalves and H. Mari, “NORA: are race-free dynamic CMOS technique for pipelined logic<br />

structures,” IEEE J. Solid-State Circuits, vol. 18, no. 6, pp. 261−263, June 1983.<br />

7. J. Silberman, et al., “A 1.0 GHz single-issue 64 b PowerPC Integer Processor,” IEEE J. Solid-State<br />

Circuits, vol. 33, no. 11, pp. 1600−1608, Nov. 1998.<br />

8. T. Thorp, G. Yee, and C. Sechen, “Monotonic CMOS and dual Vt technology,” IEEE International<br />

Symposium on Low Power Electronics and Design, pp. 151−155, June 1999.<br />

9. P. Gronowski and B. Bowhill, “Dynamic logic and latches—part II,” Proc. VLSI Circuits Workshop,<br />

Symp. VLSI Circuits, June 1996.<br />

10. P. Gronowski, et al., “High-performance microprocessor design,” IEEE J. Solid-State Circuits, vol. 33,<br />

no. 5, pp. 676−686, May 1998.<br />

11. C. J. Anderson, et al., “Physical design of a fourth generation POWER GHz microprocessor,” ISSCC<br />

Digest of Technical Papers, pp. 232−233, Feb. 2001.<br />

© 2002 by CRC Press LLC

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