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Abstracts Book - IMRC 2018

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• SD1-P006<br />

MECHANICAL AND ELECTRONIC PROPERTIES OF<br />

MECHANICALLY-BENT MONOLAYER TRANSITION METAL<br />

DICHALCOGENIDES IN THE GROUND STATE USING SCAN.<br />

Niraj K. Nepal 1 , Liping Yu 1 , Qimin Yan 1 , Adrienn Ruzsinszky 1<br />

1 Temple University, Department of Physics, United States.<br />

As an alternative to graphene, transition metal dichalcogenide (TMD)<br />

monolayers have gained a lot of interest as promising candidates for future<br />

flexible nano-electronics due to the mechanical and electronic properties<br />

related to their high flexibility [1]. Though the TMD thin layers have a promising<br />

future, traditional methods of tuning the band gap such as doping with<br />

impurities or contact engineering suffer strong Fermi-level pinning or even<br />

damage the materials. However, due to the high bending and in-plane stiffness,<br />

thin monolayer molybdenum disulfide (MoS2) can be bend mechanically to tune<br />

the band gap as well as reducing Fermi level pinning to some extent [2]. In this<br />

work [3], we extend the study to exploring the other TMD monolayers<br />

corresponding to transition metals group IV to X in the periodic table in the<br />

ground state, using the recently developed meta-GGA SCAN.<br />

References<br />

[1] D. Akinwande, et al., Extreme Mechanics Letters 13, 42 (2017).<br />

[2] L. Yu, A. Ruzsinszky, and J. P. Perdew, Nano Lett. 16, 2444 (2016).<br />

[3] N. K. Nepal, L. Yu, Q. Yan, A. Ruzsinszky (in preparation).<br />

Keywords: SCAN, TMD monolayers, Mechanical bending<br />

Presenting authors email: tug11655@temple.edu

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