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Abstracts Book - IMRC 2018

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• SA5-P012<br />

STUDY OF STRUCTURAL PROPERTIES OF NANOSTRUCTURE PbS<br />

THIN FILMS<br />

Francisco Jose Solis Pomar 1 , Abel Fundora Cruz 2 , Eduardo Gerardo Perez Tijerina 1<br />

1 Universidad Autónoma de Nuevo León, Facultad de Ciencias Físico Matemáticas, Mexico.<br />

2<br />

Universidad de La Habana, Division laser, Cuba.<br />

In this work thin films of PbS on glass substrate have been growth by RF<br />

sputtering at room temperature. The thin films have a preferential orientation<br />

in the (200) direction observed by X-ray diffraction (XRD). Atomic force<br />

microscopy (AFM) measurements revealed that PbS thin films are<br />

nanostructured, with grain size between 6 and 8 nanometers. This results<br />

confirms that the nanostructured PbS thin films can be growth by physic<br />

technique at room temperature, by future application in solar cells.<br />

Acknowledgment:<br />

The authors are grateful for the financial support of PRODEP through project<br />

DSA/103.5/16/10510<br />

Keywords: RF Sputtering, Thin Films, PbS<br />

Presenting authors email: francisco.solispm@uanl.edu.mx

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