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Abstracts Book - IMRC 2018

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• SF2-O018<br />

FABRICATION AND CHARACTERIZATIONS OF A CuInSe2 THIN<br />

FILM BY A THREE-STAGE HYBRID METHOD<br />

Ashok Adhikari 1 , Jorge Sergio Narro Rios 1 , Ganesh Regmi 1 , Velumani Subramaniam 1<br />

1 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, Sección de Electrónica<br />

del Estado Sólido (SEES), Mexico.<br />

Copper indium diselenide (CISe) chalcopyrite has a tetragonal crystal structure,<br />

direct band gap (1.04 eV), high absorption coefficient (≈10 5 cm -1 ) and high<br />

stability, because of these properties it comports as a reliable absorber layer. In<br />

this work, CISe thin film was prepared by a three-stage hybrid (3SH) method that<br />

includes uniting vacuum and non-vacuum techniques. Vacuum methods are<br />

relatively high-efficiency processes as compared to non-vacuum processes., but<br />

a the same time, non-vacuum processes are economical, easy scale-up, high<br />

material utilization than vacuum methods. In this 3SH method, the first stage<br />

uses non-vacuum chemical spray pyrolysis (CSP), 2 nd and 3 rd stages use vacuum<br />

co-evaporation. The first stage beggings with the deposition of γ-In 2 Se 3 over<br />

soda lime glass (SLG) substrates, of N,N-dimethyl selenourea (0.0045 M) and<br />

InCl 3 (0.0015M) as precursors of Se and In respectively by CSP, were carried out<br />

with a temperature range 300°C- 340°C. In the second stage, a subsequent coevaporation<br />

of Cu-Se is performed onto the prepared precursor of In 2 Se 3 film<br />

and followed by the third stage, which evaporates In-Se atoms under the lowpressure<br />

condition and a substrate temperature of 500°C. The structure and<br />

morphology of CISe thin films were studied by X-ray diffraction (XRD), Scanning<br />

Electron Microscopy (SEM), Raman spectroscopy, and Energy Dispersive X-ray<br />

spectroscopy (EDS) techniques. XRD results show the presence of strong CISe<br />

phase at 2 value of 26° with (112) plane and other CISe phase at 52°and 63°<br />

having planes (211) and (008) respectively. All samples have a Cu 2 Se phase at 2<br />

value of 43° with (220) plane and there is also CuSe phase occurred on the<br />

sample where the first stage deposited at a temperature of 340°C. The SEM<br />

analysis shows that all three samples have almost equal grain size on the range<br />

of 0.5-1 EDS results shows that concentration of Cu is slightly less than In<br />

concentration and more than 45% of the concentration of Se was found which<br />

is agreement with a high-efficiency solar cell. The optical characterization<br />

(Transmittance and Reflectance) by UV-Vis spectrophotometry and electrical<br />

characterization (Sheet resistance, Hall Effect studies) by Van der Pauw method<br />

were carried out.

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