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Abstracts Book - IMRC 2018

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• SD3-P003<br />

EXPERIMENTAL ANALYSIS OF THE DEFORMATION TEXTURE IN<br />

METAL SAMPLES BY ELECTRON BACKSCATTER DIFRACTION<br />

Oliver Contreras Muro 1 , Adair Jimenez Nieto 1 , Jose Antonio Tiburcio Moreno 2 , Joel Moreno<br />

Palmerin 3 , Jose Manuel Juarez Garcia 4 , Jose Martin Yañez Limon 1<br />

1 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, Materiales, Mexico.<br />

2 Universidad Nacional Jorge Basadre Grohmann - Tacna, Fisica, Peru. 3 Universidad de<br />

Guanajuato, Minas, Metalurgia y Geologia, Mexico. 4 Centro Nacional de Metrologia,<br />

Microscopia, Mexico.<br />

In this work, an experimental analysis of the behavior of the texture of<br />

deformation and evolution of grain size, which is characteristic for a given<br />

material and the processing to which it has been subjected, is presented. In this<br />

case, samples of copper, steel 304 and aluminum are studied. Analyzing the<br />

evolution of planes and preferential directions during a deformation process<br />

typical of a stress test in different representative zones of the stress-strain curve<br />

until reaching the rupture. In which, the microstructural evolution of the<br />

samples is evidenced using optical and electronic microscopy and the analysis<br />

by EBSD (Electron Backscatter Diffraction), with this last experimental technique,<br />

the poles and inverse poles figures are determined to obtain the preferential<br />

orientations in which certain crystalline directions align with the main directions<br />

of the plastic flow of the material to obtain a greater information of the<br />

anisotropic response and microstructural evolution, during the process of<br />

deformation of the material subjected to different efforts representative of the<br />

deformation stress curve.<br />

Acknowledgment:<br />

• CONACYT (Consejo Nacional de Ciencia y Tecnologia)<br />

• Cinvestav(Centro de Investigacion y de Estudios Avanzados)<br />

• LIDTRA (Laboratorio Nacional de Investigación y Desarrollo Tecnológico<br />

de Recubrimientos Avanzados)<br />

Keywords: Electrons backscatter diffraction (EBSD), Kikuchi patterns, scanning<br />

electron microscopy (SEM)<br />

Presenting authors email: oliver.contreras@cinvestav.mx

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