Abstracts Book - IMRC 2018

• SD4-O001 Invited Talk
NOVEL SOLUTIONS ON ELECTRON MICROSCOPY FOR NANO-
MATERIALS CHARACTERIZATION
Rafael Villaurrutia 1
1 ThermoFisher Scientific, Electron Microscopy, Mexico.
In the past few years, electron microscopy techniques has undergone a major
revolution bacause of the implementation of new technologies which facilitate
the characterization of new materials. Correctors for the parasitic lens
aberrations that otherwise limit resolution, new electron sources for increasing
the signals, new and more detectors for analysis, have opened new possibilities
of study for the new generation of nanomaterials and devices. Such advances,
have been particularly significant in Scanning Transmission Electron Microscopy
technique allowing electron beams to be produced with a spot size well below
1ÅÅÅ, sufficient to resolve inter-atomic spacings in most crystal structures. This
means that the advantages of STEM can now be applied with atomic resolution
to all kind of nanostructures. This is revolutionising our understanding of new
devices, heterostructures and nanoparticles. This includes qualitative analysis of
structures with picometer precision, mapping of electric polarization at the unit
cell scale, mapping of chemestry on an atom-by-atom basis and crystallographic
orientations. In this talk the application in functional materials of such advances
in TEM are exemplified.
Keywords: Electron Microscopy, Functional materials, STEM
Presenting authors email: rafael.arenas@fei.com