Abstracts Book - IMRC 2018

• SD7-O009 Invited Talk
PHYSICAL PROPERTIES DETERMINATION OF METALLIC FILMS AT
NANOMETRIC-SCALE: AN OPEN FIELD IN NANOMATERIALS
Andres Ivan Oliva Arias 1
1 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, Applied Physics,
Mexico.
Physical properties of materials at nano-scale are quite different than their
known and reported properties in bulk. Materials with thicknesses minor than
100 nm can present different values in their physical properties. Actual advances
in nanoscience and nanotechnology requires knowing their real properties
values as a function of the nano-thickness for devices design. Additionally, new
and different methodologies require to be implemented for determining the
values of these properties. In this talk, new analytical and experimental
methodologies and the first efforts for quantifying the elastic modulus (E),
specific heat (C p ), thermal conductivity (k), thermal diffusivity (D), and thermal
effusivity (e) values for some metallic films (gold, aluminum, and copper) are
discussed. The thermo- and piezo-resistive effects for determining the
temperature coefficient of resistance (TCR) and the thermal expansion
coefficient (TEC) of gold with nano-thickness are also reported. Higher values of
E, C p , TEC and lower values of TCR, e, D, and k parameters than the bulk value
are reported when the metallic film thickness is reduced 100 to 10 nm. The
proposed methodologies can be used for determining the same properties of
other metallic films used for nano-devices fabrication.
References
[1] J.M. Lugo, V. Rejón, A.I. Oliva. J. Heat Transfer. 137 (2015) 051601.
[2] J. M. Lugo, A.I. Oliva. J. Thermophys. Heat Transfer. 30 (2017) 481-489.
[3] P. Várguez, F. Avilés A.I. Oliva. Surf. & Coat. Technol. 202 (2008) 1556-1563.
[4] A.I. Oliva, et al. Thin Solid Films. 623 (2017) 84-89.
Acknowledgment: Author thanks for the technical help of J.E. Corona, D.
Aguilar, Dora Huerta, M. Romero, and Wilian Cauich. Specially to Dr. J.M. Lugo,
for his useful discussions and colaboration.
Keywords: thermo-electric properties, metallic films, nano-thickness
Presenting authors email: oliva@cinvestav.mx