Abstracts Book - IMRC 2018

• SA6-P112
OPTICAL CHARACTERIZATION OF VO2 THIN FILMS BY UV-VIS-IR
ELLIPSOMETRY
Jorge Andres Ramirez Rincon 1 , Cindy Lorena Gomez Heredia 1 , Alan Corvisier 2 , Thierry
Girardeau 2 , Jose Ordonez Miranda 2 , Karl Joulain 2 , Younes Ezzahri 2 , Oscar Ares Muzio 1 , Juan Jose
Alvarado Gil 1
1 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, Applied Physics,
Mexico. 2 CNRS, Institut Pprime, Physics, France.
Thermochromic materials are of huge interest for the management and storage
of thermal energy [1]. Vanadium dioxide (VO2) is especially suitable for these
purposes due to its dielectric-to-metal transition [2], which involve important
changes on its electrical, thermal, and optical properties [3] for temperatures
around 68 °C. In this study, VO2 thin films (120 nm and 200 nm of thickness)
deposited via laser ablation on sapphire c-cut and r-cut substrates, have been
optically characterized using ellipsometric spectroscopy on a wavelength range
0.2 to 18 microns. Using a combination of Cody-Lorentz and Drude oscillators
[4], the spectral permittivity and thermal emittance of each sample have been
determined as functions of temperature, within the phase transition zone.
Moreover, it is shown that the average emissivity on the wavelength range 2μm
to 15μm is in good agreement with the corresponding one obtained through the
thermal wave resonant cavity (TWRC) [5].
References:
[1] Ordoñez-Miranda J, Ezzahri Y, Drevillon J, and Joulain K, J. Appl. Phys 119,
203105 (2016).
[2] Yanda J, Zhang Y, Gao M, Yuan Z, Xia,Y, et.al, Nature 4, 4854 (2014)
[3] Qazilbach M, Brehm M, Cahe, B, Ho, P-C, Andreev G, et.al, Science, 318,
1750-1753 (2007)
[4] Houska J, Kolenaty D, Rezek J, and Vlcek J, Appl Surf Sc 421, 529-534 (2017).
[5] Ordoñez-Miranda J, and Alvarado-Gil J.J, Int. J. Therm. Sci. 74, 208e213,
(2013)
Keywords: Vanadium dioxide, UV-Vis-IR Ellipsometry spectroscopy, Optical properties
Presenting authors email: jorge.ramirezr@cinvestav.mx