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Abstracts Book - IMRC 2018

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• SA4-P007<br />

LUMINESCENT THIN FILMS BASED ON SILICON OXYCARBIDE<br />

OBTAINED WITH MONOMETHYL-SILANE BY HWCVD TECHNIQUE<br />

Juan Ramon Ramos Serrano 1 , Yasuhiro Matsumot Kuwabara 1,2 , Crisoforo Morales Ruiz 3<br />

1 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, Program of<br />

Nanoscience and Nanotechnology, Mexico. 2 Centro de Investigación y de Estudios Avanzados<br />

del IPN - CINVESTAV, Sección de Electrónica del Estado Sólido, Mexico. 3 Benemerita<br />

Universidad Autonoma de Puebla, Centro de Investigación en Dispositivos Semiconductores,<br />

Mexico.<br />

This work presents a study of the changes in the optical, morphological and<br />

compositional properties of silicon oxycarbide thin films obtained by hot wire<br />

chemical vapor deposition (HWCVD) technique. A mixture of hydrogen, oxygen<br />

and monomethyl-silane (MMS) was used as reactant gas. To decompose the<br />

gases in the reaction chamber a Tantalum wire was used as catalyst at constant<br />

temperature of 1750 °C. The properties of the deposited-films were studied<br />

varying the oxygen flow and the substrate temperature, keeping constants the<br />

hydrogen to MMS flow relation, the chamber pressure and the deposition time.<br />

Changes in the composition of the films were observed in relation to the oxygen<br />

flow through Fourier Transform Infrared spectroscopy (FTIR), ellipsometry and<br />

energy dispersive X-ray spectroscopy (EDS) measurements, while scanning<br />

electronic microscopy (SEM) imagens didnt show significant changes in the<br />

superficial morphologies. Besides, all samples obtained at low oxygen flows<br />

presented a very low emission, while those obtained at higher flow presented a<br />

wide and intense band emission in the visible spectrum centered in the greenblue<br />

region. Additionally, time resolved photoluminescence (TRPL)<br />

measurements were performed. The TRPL results suggest that the emission is<br />

due to a combination of quantum confinement effects and defects related to<br />

SiOx matrix.<br />

Keywords: monomethyl-silane, silicon oxycarbide, visible PL<br />

Presenting authors email: juan.ramos@cinvestav.mx

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