Abstracts Book - IMRC 2018

• SD3-O003
A COMPARISON OF ELECTRON BACKSCATTER DIFFRACTIONS
PATTERN INDEXING VIA CONVENTIONAL AND DICTIONARY
METHODS
Stuart Wright 1,2
1 Carnegie Mellon University, Materials Science and Engineering, United States. 2 EDAX, TSL,
United States.
Electron Backscatter Diffraction (EBSD) is often used to characterizing both
the texture of polycrystalline materials as well as the crystallographic
relationships between phases, between grains at grain boundaries or even
within individual grains (in particular, grains having undergone deformation).
Indexing (i.e. orientation determination) of EBSD patterns is conventionally
done using an approach based on band detection via the Hough Transform
followed by automated identification of the (hkl) indices associated with the
bands based on the angle between the detected bands and the known
interplanar angles of the crystal structure. Recently, a new approach has been
developed based on matching of experimental patterns with a dictionary of
simulated patterns. This approach, while much slower than the conventional
approach, can provide an improvement on the conventional approach
particularly when the patterns have a low signal-to-noise ratio. The sensitivity of
the both approaches to various parameters including noise, projection center
uncertainty and pattern size will be presented.
Acknowledgment:
The authors wish to acknowledge an Air Force Office of Scientific
Research (AFOSR) MURI program (contract # FA9550-12-1-0458) as well as the
computational facilities of the Materials Characterization Facility at CMU
under grant # MCF-677785. We also acknowledge the contributions of Saransh
Singh and Marc De Graef to this work.
Keywords: EBSD, orientation, texture
Presenting authors email: stuart.wright@ametek.com