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Abstracts Book - IMRC 2018

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• SD6-O005<br />

PROBING NANOSCALE STRUCTURE OF DISORDERED MATERIALS<br />

USING 4-DIMENSIONAL SCANNING TRANSMISSION ELECTRON<br />

MICROSCOPY<br />

Menglin Zhu 1 , Soohyun Im 1 , Michelle Paquette 2 , Nathan Oyler 3 , Paul Rulis 2 , Ridwan Sakidja 4 ,<br />

Jinwoo Hwang 1<br />

1 The Ohio State University, Materials Science and Engineering, United States. 2 University of<br />

Missouri, Department of Physics and Astronomy, United States. 3 University of Missouri,<br />

Department of Chemistry, United States. 4 Missouri State University, Physics, Astronomy, and<br />

Materials Science, United States.<br />

We present a novel electron nanodiffraction technique based on 4-dimensional<br />

scanning transmission electron microscopy (4-D STEM) that can determine the local<br />

structural heterogeneity in nanoscale functional materials. Despite recent advances<br />

in materials characterization, the characterization of complex materials still remains<br />

challenging, especially when the material has low dimensionality and/or includes<br />

significant degree of disorder. We have advanced 4-D STEM, which has been<br />

recently enabled due to the development of fast pixelated STEM detectors, to<br />

determine the nanoscale structure of disordered ceramic thin films for electronic<br />

and functional applications. Using 4-D STEM, we acquire nanodiffraction patterns<br />

from individual nanoscale volume of the sample with spatial oversampling and a<br />

high signal to noise ratio. Subsequent analyses of the nanodiffraction data using<br />

structural fluctuation and angular correlation function can determine the details of<br />

structural heterogeneity at the nanoscale, including the type, size, connection, and<br />

volume fraction of medium range order comprised of the connection of the nearest<br />

neighbor clusters, which has been difficult to achieve using conventional diffraction<br />

or imaging methods in the past. We show that the new information on MRO<br />

precisely correlates to the materials’ important properties, including dielectric<br />

constant and mechanical stability. This promising new characterization method can<br />

therefore advance our understanding on important structure-property<br />

relationships, not only in disordered materials but also in any other nanomaterials<br />

systems where extended defects and structural heterogeneity dictate the<br />

important properties of the system.<br />

Acknowledgment: We acknowledge support from the National Science<br />

Foundation (NSF) DMREF under DMR-1729086.<br />

Keywords: Amorphous, Nanodiffraction, MRO<br />

Presenting authors email: hwang.458@osu.edu

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