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Abstracts Book - IMRC 2018

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• SF2-P058<br />

BI-TE BASED TOPOLOGICAL INSULATORS COMPOUNDS BY<br />

PHYSICAL VAPOR TRANSPORT<br />

Omar Concepción 1 , Osvaldo de Melo 2 , Arturo Escobosa 3<br />

1 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, Programa de<br />

Doctorado en Nanociencias y Nanotecnología, Mexico. 2 Universidad de La Habana, Physics<br />

Faculty, Cuba. 3 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, SEES,<br />

Mexico.<br />

For decades, Bi2Te3 has been studied as thermoelectric materials and recently as<br />

topological insulator (TI). However, other Bi-Te phases exist which have received<br />

much less attention. In fact, there have been reported at least seven different crystal<br />

structures in the Bi-Te system but there are only a few reports on the preparation<br />

of other phases different from Bi2Te3. The combination of Bi2Te3 and Bi bilayers,<br />

which forms the different Bi-Te compounds, it should be expected that they will also<br />

have a TI behavior.<br />

This work presents a systematic study of the physical vapor transport (PVT) growth<br />

of Bi-Te material focused in determining the adequate conditions for the<br />

preparation of pure Bi2Te3 (tellurobismuthite), BiTe (tsumoite) or Bi4Te3 (pilsenite).<br />

The samples were characterized by X-ray diffraction, Raman spectroscopy,<br />

Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy.<br />

The ability of the PVT technique to control the stability of different phases in the Bi-<br />

Te system was demonstrated by optimizing the carrier gas flow and the substrate<br />

temperature: for small flows, Te rich phases stabilize while by increasing the flow,<br />

Bi richer phases are obtained. In vacuum this is not possible due to the transport<br />

regime. The morphology between the pure Bi-Te phase samples was different. Hall<br />

measurements showed that room temperature mobility decreases with increasing<br />

Bi concentration.<br />

Acknowledgment: The authors want to thank A. Tavira for XRD measurements,<br />

M. Galván for Raman measurements, J. Roque for SEM images, D. Bahena for<br />

AFM images, M. Manso for XPS measurements, V. Torres and A. Climent for<br />

RBS measurements, MPI-CPfS and the financial support of CONACYT and the<br />

program “Cátedras de Excelencia de la Comunidad de Madrid”.<br />

Keywords: Topological insulator, Physical vapor transport, Bismuth telluride phases<br />

Presenting authors email: ocdiaz89@gmail.com

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