Abstracts Book - IMRC 2018

• SE2-P066
STRUCTURAL AND OPTICAL STUDY OF ZnTe THIN FILMS GROWN
BY LASER ABLATION
Maria Alicia Ramirez 1 , Fray de Landa Castillo Alvarado 1,2 , Concepción Mejía García 1,2 , Jorge
Aguilar Hernández 1,2 , David Omar Flores Tavira 1,2 , Luis Arturo Martinez Ara, 1,2 , Miguel Angel
Ibarra 1,3 , Miguel Angel Serviles 1,4 , Adolfo Tavira Fuentes 1,3
1 Escuela Superior de Física y Matemáticas IPN, Materiales, Mexico. 2 Centro de Investigación y
de Estudios Avanzados del IPN - CINVESTAV, SEE, Mexico. 3 Centro de Investigación y de
Estudios Avanzados del IPN - CINVESTAV, Sección de Electrónica del Estado Sólido, Mexico.
4 Centro de Investigación y de Estudios Avanzados del IPN - CINVESTAV, Fisica, Mexico.
ZnTe thin films grown on several substrates (quartz, glass and Si) have been
prepared by laser ablation technique at a residual pressure about 10−6 Torr . The
ZnTe films have been characterized structural and morphologycally by X-ray
diffraction (XRD) and scanning electron microscopy (SEM), respectively. X-ray
diffraction technique showed that the ZnTe films are polycrystallines and have a
cubic structure. The XRD standards have been used to determine the
microstructural parameters crystal size in of (111). The SEM images show that the
ZnTe grains are uniformly distributed on the entire surface of the three substrates
(quartz, glass and Si) and the films present grains defects. Optical properties of
ZnTe films were studied extensively in the energy range of 2.1eV and 2.3eV
by photoluminescence (PL) technique assign the 2.23-eV band to the emission of
donor–acceptor pairs . In the molecular structure, it was analyzed by Raman
technique. In the studied films of ZnTe direct transitions are produced.
Acknowledgment:
M.A. Ramirez-Cruz,a F.L. Castillo-Alvarado,a C. Mejía-García,a J. Aguilar-
Hernández,a D.O. Flores-Tavira,a L.A. Martinez-Ara,a M.A. Avendaño-Ibarra,b
M.A. Guillen-Serviles,c A. Tavira- Fuentes,b .
a) Escuela Superior de Física y Matemáticas, Instituto Politécnico Nacional, Unidad
Profesional Adolfo López Mateos, Edif.9, C.P. 07738, México D.F., México
b) Sección de Electrónica del Estado Sólido, Centro de Investigación y de Estudios
Avanzados del I. P.N., Av. IPN 2508, Col. Zacatenco, D. F., Mexico.
c) Departamento de Física, Centro de Investigación y Estudios Avanzados del
Instituto Politécnico Nacional, CINVESTAV-IPN, A.P. 14-740, México D.F. 07360,
México
Keywords: ZnTe thin films, structural properties, structural properties
Presenting authors email: alirc141@gmail.com