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Abstracts Book - IMRC 2018

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• SB4-O017<br />

STUDY OF THE PHYSICAL PROPERTIES OF BI2S3 /PANI THIN FILMS<br />

OBTAINED BY SOLUTION PROCESS FOR ELECTRONIC DEVICES<br />

APPLICATIONS<br />

Brayan German Rivas Valles 1 , Maria de la Luz Mota 2,3 , Francisco Servando Aguirre Tostado 4 ,<br />

Roberto C. Ambrosio Lázaro 5 , Mijung Lee 6 , Amanda Carrillo Castillo 1<br />

1<br />

Universidad Autónoma de Ciudad Juárez, Departamento de Ingeniería Eléctrica y<br />

Computación, Instituto de Ingeniería y Tecnología, Mexico. 2 Consejo Nacional de Ciencia y<br />

Tecnologia - CONACYT, Departamento de Ingeniería Eléctrica y Computación, Instituto de<br />

Ingeniería y Tecnología, Mexico. 3 Universidad Autónoma de Ciudad Juárez, Departamento de<br />

Ingeniería Eléctrica y Computación, Mexico. 4 Centro de Investigación en Materiales Avanzados,<br />

S.C., Unidad Monterrey, Mexico. 5 Benemerita Universidad Autonoma de Puebla, , Mexico.<br />

6 Kookmin University, School of Advanced Materials Engineering, Korea.<br />

Semiconductor materials are highly used in industry and research. Bismuth<br />

sulfide (Bi2S3) has caught researchers’ attention because of his low band gap,<br />

relative abundance and low toxicity. However, its application in electronic<br />

devices has been hindered due to its high resistance. Many alternatives have<br />

been developed, thermal treatments to electron induced modifications. Here,<br />

we have prepared bismuth sulfide thin films by chemical bath deposition<br />

achieving good grain morphology, band gap, and homogenous deposition. We<br />

proposed the use of an organic semiconductor polyaniline (PANI) in order to<br />

enhance the electrical performance of these thin films. We studied the use of<br />

PANI obtained by oxidative polymerization at different oxidation states. Optical<br />

characterization was performed to evaluate the band gap and four point probe<br />

measurements were used to determine the resistivity. SEM micrographs<br />

showed the homogeneous characteristic of the films surface. XDR analysis was<br />

used to determine the structural characteristics. Bi2S3 /PANI thin films are a<br />

suitable candidate for device applications requiring low temperatures for<br />

processing.<br />

Acknowledgment:<br />

To research proyects CB-2013-01 221117 and PN 2016 3529.<br />

Keywords: Bi2S3, Polyaniline, Thin films<br />

Presenting authors email: al131563@alumnos.uacj.mx

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