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Abstracts Book - IMRC 2018

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• SD3-O002<br />

ANISOTROPIC DEFECT ACCUMMULATION IN ROLLED ALUMINUM<br />

BY EBSD AND XRD<br />

Emanuel Benatti 1,2 , Natalia de Vincentis 1,2 , Martina Cecilia Avalos 1,2 , Francisco Cruz Gandarilla 3 ,<br />

Heinz-Günter Brokmeier 4 , Raul Eduardo Bolmaro 1,2<br />

1 Instituto de Fisica Rosario, Materials Science Laboratory, Argentina. 2 Universidad Nacional de<br />

Rosario, , Argentina. 3 Instituto Politécnico Nacional - IPN, Escuela Superior de Física y<br />

Matemáticas., Mexico. 4 Helmholtz Zentrum Geesthacht, Institut für Werkstoffkunde und<br />

Werkstofftechnik, Germany.<br />

Severe Plastic Deformation (SPD) can generate large microstructural changes in<br />

metals and alloys and there is a strong evidence about crystals accumulating<br />

energy not only due to the alloy or deformation process but also in function of<br />

their orientation. However, there are no general rules to explain or calculate the<br />

stored energy on SPD materials. The qualitative and quantitative<br />

comprehension of such processes, as well as about the evolution of defect<br />

structures, could allow to predict more precisely the response of different<br />

materials subject to various deformation and heat treatment processes.<br />

We present correlations between EBSD and XRD results obtained in AA1050 Al<br />

sheets subject to rolling until reaching 70 % thickness reduction.<br />

XRD experiments were performed in PETRA-III, DESY synchrotron beam in<br />

Hamburg, Germany. Results were obtained by collecting 37 complete Debye-<br />

Scherrer image plates in transmission geometry with a highly parallel ~86.3 KeV,<br />

100 µm x 100 µm synchrotron beam. Generalized Pole Figures (GPF) were<br />

obtained for defects and later on used to calculate Generalized Distribution<br />

Functions (GDF) by using MTEX toolbox.<br />

Electron Back Scattering Diffraction (EBSD) scans have been performed to<br />

calculate several misorientation related parameters, like GOS, GAM, KAM and<br />

GND and grain size, The results were obtained in a FEG-SEM Quanta 200 FEI<br />

equipped with TSL-OIM 7.3 acquisition and processing software. Comparison<br />

between those two different techniques may shed light on the complex<br />

mechanisms of further recovery and recrystalization phenomena.<br />

Keywords: Defects, Microstructure, EBSD<br />

Presenting authors email: bolmaro@ifir-conicet.gov.ar

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