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Demand test descriptions and error codes - Avaya Support

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Far-End Internal Loopback Test (#797)<br />

This <strong>test</strong> starts at the specified DS1 converter circuit pack location, traverses over the specified<br />

facility, <strong>and</strong> loops at the internal facility interface on the other DS1 converter circuit pack in the<br />

DS1 converter complex. See Figure 109: Far-End Internal Loopback Test Configuration.<br />

The <strong>test</strong> sends digital data through every DS1 chel on this facility. For TN574 DS1 Converter<br />

facilities, <strong>test</strong> patterns are sent through every DS1 chel. For TN1654 DS1 Converter facilities,<br />

<strong>test</strong> patterns are sent through one DS1 chel.<br />

If there is only one DS1 facility available, the system will not allow that last facility to be busied<br />

out. In that case, the DS1 converter circuit pack must be busied out before executing this <strong>test</strong>.<br />

For a st<strong>and</strong>ard-, duplex-, or high-reliability system (no PNC duplication), if there is only one DS1<br />

facility available, then this <strong>test</strong> can only be executed at the endpoint that is closer to the server<br />

relative to the neighbor DS1 converter circuit pack because of its impact on the system control<br />

links. For TN574 DS1 converter boards, the completion of the <strong>test</strong> will be delayed in this<br />

configuration to wait for the recovery of the system control links. For a critical-reliability system<br />

(PNC duplication) or for a system with multiple DS1 facilities, the <strong>test</strong> can be executed on any<br />

DS1 converter circuit pack.<br />

If the <strong>test</strong> passes on a TN1654 DS1 facility, the round trip delay time appears in milliseconds in<br />

the Error Code field. The round trip delay time is the length of time in milliseconds it takes for<br />

the firmware to receive the <strong>test</strong> pattern after it has been sent.<br />

This <strong>test</strong> runs on the DS1-FAC (DS1 Facility) maintenance object.<br />

Figure 109: Far-End Internal Loopback Test Configuration<br />

Table 454: Far-End Internal Loopback Test (#797) 1 of 3<br />

Error<br />

Code<br />

DS1CONV<br />

A<br />

Test starts here<br />

Test<br />

Result<br />

CSU<br />

A<br />

DS1 Facility<br />

Description / Recommendation<br />

Loop at internal interface<br />

for the DS1 facility<br />

. . .<br />

. DS1CONV<br />

. B<br />

.<br />

. . .<br />

2000 ABORT Timed out while waiting for a response from the circuit pack.<br />

1. Retry the comm<strong>and</strong> at 1-minute intervals up to 3 times.<br />

CSU<br />

B<br />

1 of 3<br />

Issue 5 May 2009 1513

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