Demand test descriptions and error codes - Avaya Support

Table 455: DS1 Interface Options Audit (#798) 2 of 2
Error
Code
Test
Result
Description / Recommendation
Near-End External Loopback Test (#799)
Near-End External Loopback Test (#799)
PASS The DS1 Interface options were successfully sent to the circuit pack.
2 of 2
This test is destructive.
This test starts at the specified DS1 converter circuit pack location, traverses over the specified
facility, and loops back at the manually hard-wired external loopback device. Depending on the
type of physical connectivity of the DS1 facility, special tools, cables or connectors may be
required to make the hard-wired loopbacks.
To isolate a problem, set the loopback first at the loopback point LB 1, and then at the loopback
point LB 2. See Figure 110: Loopback Points for Test #799 and Figure 19: DS1 Facility
Connections. Place the loopbacks at as many points as your CSU capabilities will allow.
Hard-wired loopbacks at the far end are not desirable, because the equalization-level
adjustments may cause problems.
Every part of this test is executed under firmware control and the result is sent back to the
system. The test is executed by sending digital data through every DS1 chel on this DS1 facility.
This test is executed using test ds1-facility location external-loopback. It is not
part of the long test sequence because it requires modifications to the physical connectivity of
the DS1 facility.
If there is only one DS1 facility available, the system will not allow the last facility to be busied
out. In that case, the DS1 converter circuit pack must be busied out before executing this test.
For a standard-, duplex-, or high-reliability system (no PNC duplication), if there is only one DS1
facility available, then this test can only be executed at the endpoint that is closer to the server
relative to the neighbor DS1 converter circuit pack because of its impact on the system control
links. For a critical-reliability system (PNC duplication) or for a system with multiple DS1
facilities, the test can be executed at any DS1 converter circuit pack.
If the test passes on a TN1654 DS1 facility, the round trip delay time will be displayed in
milliseconds in the Error Code field. The round trip delay time is defined as the length of time
in milliseconds it takes for the firmware to receive the test pattern after it has been sent. This
measurement is taken on the last DS1 chel tested.
This test runs on the DS1-FAC (DS1 Facility) maintenance object.
Issue 5 May 2009 1517