Demand test descriptions and error codes - Avaya Support

Table 485: CPE Loopback Jack Test (#1212) 2 of 3
Error
Code
Test
Result
Description / Recommendation
CPE Loopback Jack Test (#1212)
1039 ABORT The DS1 Interface circuit pack is providing timing for the system.
Executing this test could cause major system disruption. If the DS1
Interface circuit pack needs to be tested, set the synchronization
reference to another DS1 Interface circuit pack or to the Tone-Clock
circuit with the following command sequence:
1. disable synchronization-switch.
2. set synchronization location.
3. enable synchronization-switch.
1950 ABORT Another loopback/span test is already executing on the DS1 board or the
board is in a network requested loopback mode (Line loopback or Payload
loopback). The error log will indicate whether a Customer loopback jack
test, Far CSU Loopback test, or the One-Way Span test is executing or if
the board is in line loopback or payload loopback mode. Only one
long-duration loopback/span test can be active at a given time.
If a loopback/span test is already active, that test must be deactivated via
test ds1-loop location end-loopback/span-test in order to
run this test.
2000 ABORT Response to the test was not received within the allowed time.
1. Check for board hyperactivity. See Hyperactive DS1/UDS1
Interface Circuit Pack/Media Module.
2100 ABORT Could not allocate the necessary system resources to run this test.
1. Retry the command at 1-minute intervals up to 5 times.
2 FAIL The CLJ-LB test failed because it was not set up properly. The DS1
interface pack could not successfully put the CPE loopback jack into
loopback mode.
1. Enter test ds1-loop location
cpe-loopback-jack-test-begin.
2. If the test continues to fail, the problem could be with the DS1
board, the CPE loopback jack equipment, or somewhere between.
Run test ds1-loop location ds1/csu-loopback-tests
to determine if the loopback tests that are closer to the DS1 board
are successful. If any of the tests fail, follow the maintenance
strategy that is associated with the failing test.
2 of 3
Issue 5 May 2009 1587